On a New Modification of the Weibull Model with Classical and Bayesian Analysis

Modelling data in applied areas particularly in reliability engineering is a prominent research topic. Statistical models play a vital role in modelling reliability data and are useful for further decision-making policies. In this paper, we study a new class of distributions with one additional shape parameter, called a new generalized exponential-X family. Some of its properties are taken into account. The maximum likelihood approach is adopted to obtain the estimates of the model parameters. For assessing the performance of these estimators, a comprehensive Monte Carlo simulation study is carried out. The usefulness of the proposed family is demonstrated by means of a real-life application representing the failure times of electronic components. The fitted results show that the new generalized exponential-X family provides a close fit to data. Finally, considering the failure times data, the Bayesian analysis and performance of Gibbs sampling are discussed. The diagnostics measures such as the Raftery-Lewis, Geweke, and Gelman-Rubin are applied to check the convergence of the algorithm.