Study on step-stress accelerated life testing for the burr-xii distribution using cumulative exposure model under progressive type-II censoring with real data example

A simple step-stress accelerated life test (ALT) under progressive censoring of Type-II is considered in this paper. To minimize lifespan and decrease test cost, progressive type-II censoring and accelerated life testing are given. When the lifetime of test units matches the distribution of Burr-XII, cumulative exposure model is assumed. Also, model parameters maximum likelihood estimates (MLEs) are obtained. Furthermore, to demonstrate the proposed methods, actual dataset is analyzed. Lastly, estimators' estimated confidence intervals (CIs) are extracted.