Simulation study of noise effect on shapiro steps in high-T c josephson junctions using RCLSJ model

Jamal Akhtar Khan; Abdulaziz S. Almazyad; M. Shahabuddin

doi:10.1007/s10948-010-1072-6

Simulation study of noise effect on shapiro steps in high-T _c josephson junctions using RCLSJ model

Jamal Akhtar Khan
, Abdulaziz S. Almazyad
, M. Shahabuddin

Research output: Contribution to journal › Article › peer-review

4 Scopus citations

Abstract

The current voltage characteristics of Josephson junctions at finite temperatures under microwave irradiation are simulated in the resistively, capacitively, inductively shunted junction (RCLSJ) model including white noise. The simulated results as function of microwave power clearly show the appearance of Shapiro steps. It is shown that higher steps are suppressed for low microwave amplitudes. The rounding of the Shapiro steps observed experimentally has been reproduced by taking noise into consideration in RCLSJ model.

Original language	English
Pages (from-to)	1649-1651
Number of pages	3
Journal	Journal of Superconductivity and Novel Magnetism
Volume	24
Issue number	5
DOIs	https://doi.org/10.1007/s10948-010-1072-6
State	Published - Jul 2011
Externally published	Yes

Keywords

High T superconductor
Josephson device
Josephson junction
Shapiro steps

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10.1007/s10948-010-1072-6

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title = "Simulation study of noise effect on shapiro steps in high-T c josephson junctions using RCLSJ model",

abstract = "The current voltage characteristics of Josephson junctions at finite temperatures under microwave irradiation are simulated in the resistively, capacitively, inductively shunted junction (RCLSJ) model including white noise. The simulated results as function of microwave power clearly show the appearance of Shapiro steps. It is shown that higher steps are suppressed for low microwave amplitudes. The rounding of the Shapiro steps observed experimentally has been reproduced by taking noise into consideration in RCLSJ model.",

keywords = "High T superconductor, Josephson device, Josephson junction, Shapiro steps",

author = "Khan, \{Jamal Akhtar\} and Almazyad, \{Abdulaziz S.\} and M. Shahabuddin",

year = "2011",

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doi = "10.1007/s10948-010-1072-6",

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AU - Khan, Jamal Akhtar

AU - Almazyad, Abdulaziz S.

AU - Shahabuddin, M.

PY - 2011/7

Y1 - 2011/7

N2 - The current voltage characteristics of Josephson junctions at finite temperatures under microwave irradiation are simulated in the resistively, capacitively, inductively shunted junction (RCLSJ) model including white noise. The simulated results as function of microwave power clearly show the appearance of Shapiro steps. It is shown that higher steps are suppressed for low microwave amplitudes. The rounding of the Shapiro steps observed experimentally has been reproduced by taking noise into consideration in RCLSJ model.

AB - The current voltage characteristics of Josephson junctions at finite temperatures under microwave irradiation are simulated in the resistively, capacitively, inductively shunted junction (RCLSJ) model including white noise. The simulated results as function of microwave power clearly show the appearance of Shapiro steps. It is shown that higher steps are suppressed for low microwave amplitudes. The rounding of the Shapiro steps observed experimentally has been reproduced by taking noise into consideration in RCLSJ model.

KW - High T superconductor

KW - Josephson device

KW - Josephson junction

KW - Shapiro steps

UR - https://www.scopus.com/pages/publications/79960700705

U2 - 10.1007/s10948-010-1072-6

DO - 10.1007/s10948-010-1072-6

M3 - Article

AN - SCOPUS:79960700705

SN - 1557-1939

VL - 24

SP - 1649

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JO - Journal of Superconductivity and Novel Magnetism

JF - Journal of Superconductivity and Novel Magnetism

IS - 5

ER -

Simulation study of noise effect on shapiro steps in high-T _c josephson junctions using RCLSJ model

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Keywords

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