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Memory test and repair technique for SoC based devices
Mohammed Altaf Ahmed
,
Abubaker E.M. Eljialy
, Sultan Ahmad
Information Systems
Prince Sattam Bin Abdulaziz University
Research output
:
Contribution to journal
›
Article
›
peer-review
7
Scopus citations
Overview
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Engineering
Faulty Cell
100%
Chip Architecture
33%
Test Solution
33%
Computer Science
Test Controller
66%
Chip Architecture
33%