Interferometric testing and description of polarization ray tracing in multi-layer thin films

A. M. Sadik; M. A. El-Morsy; M. A. Shams-Eldin

doi:10.1088/1464-4258/10/11/115003

Interferometric testing and description of polarization ray tracing in multi-layer thin films

A. M. Sadik
, M. A. El-Morsy
, M. A. Shams-Eldin

Mansoura University

Research output: Contribution to journal › Article › peer-review

2 Scopus citations

Abstract

The production of thin films and their use in different industries necessitates the determination of their optical properties. This paper proposes an extended mathematical model of the output fringe field interference pattern. A general interference formula based on variable-incidence-angle polarizing interference microscopy has been derived for measurement of the optical properties of multi-layer thin film. In comparison with other well-known interferometric methods, the measurement accuracy of this new method is discussed. An example of applications to polypropylene sulfide (treated; coated on both sides with PVDC co-polymer) thin film is given.

Original language	English
Article number	115003
Journal	Journal of Optics A: Pure and Applied Optics
Volume	10
Issue number	11
DOIs	https://doi.org/10.1088/1464-4258/10/11/115003
State	Published - 1 Nov 2008
Externally published	Yes

Keywords

Directional refractive indices
Fringe deflection
Interferometric formula
Multi-layer thin film
Polarizing interference microscope
Thickness
Variable incidence angle

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10.1088/1464-4258/10/11/115003

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title = "Interferometric testing and description of polarization ray tracing in multi-layer thin films",

abstract = "The production of thin films and their use in different industries necessitates the determination of their optical properties. This paper proposes an extended mathematical model of the output fringe field interference pattern. A general interference formula based on variable-incidence-angle polarizing interference microscopy has been derived for measurement of the optical properties of multi-layer thin film. In comparison with other well-known interferometric methods, the measurement accuracy of this new method is discussed. An example of applications to polypropylene sulfide (treated; coated on both sides with PVDC co-polymer) thin film is given.",

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AU - El-Morsy, M. A.

AU - Shams-Eldin, M. A.

PY - 2008/11/1

Y1 - 2008/11/1

N2 - The production of thin films and their use in different industries necessitates the determination of their optical properties. This paper proposes an extended mathematical model of the output fringe field interference pattern. A general interference formula based on variable-incidence-angle polarizing interference microscopy has been derived for measurement of the optical properties of multi-layer thin film. In comparison with other well-known interferometric methods, the measurement accuracy of this new method is discussed. An example of applications to polypropylene sulfide (treated; coated on both sides with PVDC co-polymer) thin film is given.

AB - The production of thin films and their use in different industries necessitates the determination of their optical properties. This paper proposes an extended mathematical model of the output fringe field interference pattern. A general interference formula based on variable-incidence-angle polarizing interference microscopy has been derived for measurement of the optical properties of multi-layer thin film. In comparison with other well-known interferometric methods, the measurement accuracy of this new method is discussed. An example of applications to polypropylene sulfide (treated; coated on both sides with PVDC co-polymer) thin film is given.

KW - Directional refractive indices

KW - Fringe deflection

KW - Interferometric formula

KW - Multi-layer thin film

KW - Polarizing interference microscope

KW - Thickness

KW - Variable incidence angle

UR - https://www.scopus.com/pages/publications/58149311244

U2 - 10.1088/1464-4258/10/11/115003

DO - 10.1088/1464-4258/10/11/115003

M3 - Article

AN - SCOPUS:58149311244

SN - 1464-4258

VL - 10

JO - Journal of Optics A: Pure and Applied Optics

JF - Journal of Optics A: Pure and Applied Optics

IS - 11

M1 - 115003

ER -

Interferometric testing and description of polarization ray tracing in multi-layer thin films

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Keywords

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