Analysis of the Structural Characterization, Electric Transport, and Dielectrical Relaxation Behavior of Ba_0.97La_0.02Ti_0.95Nb_0.04O₃ Electronic Ceramic

Ba_0.97La_0.02Ti_0.95Nb_0.04O₃ polycrystalline sample was produced through molten-salt technique. The morphological, structural, impedance and optical properties were investigated by scanning electron microscope, X-ray powder diffraction (XRD), and ultraviolet–visible diffuse reflectance spectrophotometer, respectively. XRD pattern illustrate a single-pure phase of tetragonal perovskite structure with P4/mmm group space. No impurity was noticed for present ceramic. The optical band gap (E_g) values were calculated from the absorption spectra. Notwithstanding, electrical and dielectric properties were used to analyze the dielectric constant and loss, the modulus as well as dissipation factors as functions of both frequencies and d.c bias voltage for obtained sample. The frequency (f) dependence dielectric study shows that the value of dielectric constant is high at lower frequencies and decreases with increase in frequency. It is obvious to comprehend how to overwhelm the formation of inter-grain and intra-grain, and how to restrain the propagation of Ti species is an important challenge for the realization of an alternative “high-k gate dielectric” applications. Thus, some kind of semicircular arc caused by a variety of electrically active regions can originate from grains, grain boundaries, and electrode polarization effects. The modulus mechanism indicates the non-Debye type of conduction relaxation in the material, which is supported by impedance data.