Accelerated life tests for modified kies exponential lifetime distribution: Binomial removal, transformers turn insulation application and numerical results

This paper is concerned with statistical inference of multiple constant-stress testing for progressive type-II censored data with binomial removal. The failure times of the test units are assumed to be independent and follow the modified Kies exponential (MKEx) distribution. The maximum likelihood method as well as Bayes method are used to derive both point and interval estimates of the parameters. Furthermore, a real data application for transformers turn insulation is used to illustrate the proposed methods. Moreover, this real data set is used to show that MKEx distribution can be a possible alternative model to the exponential, generalized exponential and Weibull distributions. Finally, simulation studies are carried out to investigate the accuracy of the different estimation methods.